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SN74BCT8374ANTG4
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Texas Instruments SN74BCT8374ANTG4

Manufacturer No:
SN74BCT8374ANTG4
Manufacturer:
Texas Instruments
Package:
Tube
Datasheet:
SN74BCT8374ANTG4 Datasheet
ECAD Model:
-
Description:
IC SCAN TEST DEVICE W/FF 24-DIP
Delivery:
Payment:
iso14001
iso45001
iso9001
iso13485

Product Attributes

Logic Type:Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage:4.5V ~ 5.5V
Number of Bits:8
Operating Temperature:0°C ~ 70°C
Mounting Type:Through Hole
Package / Case:24-DIP (0.300", 7.62mm)
Supplier Device Package:24-PDIP
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