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| Part Number | SN74BCT8374ANT | SN74BCT8373ANT |
|---|---|---|
| Manufacturer | Texas Instruments | Texas Instruments |
| Product Status | Obsolete | Obsolete |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Scan Test Device with D-Type Latches |
| Supply Voltage | 4.5V ~ 5.5V | 4.5V ~ 5.5V |
| Number of Bits | 8 | 8 |
| Operating Temperature | 0°C ~ 70°C | 0°C ~ 70°C |
| Mounting Type | Through Hole | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP | 24-PDIP |
